发明授权
- 专利标题: Method for reading and writing multi-level cells
- 专利标题(中): 多级单元的读写方法
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申请号: US14079518申请日: 2013-11-13
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公开(公告)号: US08724380B1公开(公告)日: 2014-05-13
- 发明人: Yuchen Zhou , Ebrahim Abedifard , Parviz Keshtbod , Mahmood Mozaffari , Kimihiro Satoh , Bing K Yen , Yiming Huai
- 申请人: Avalanche Technology Inc.
- 申请人地址: US CA Fremont
- 专利权人: Avalanche Technology, Inc.
- 当前专利权人: Avalanche Technology, Inc.
- 当前专利权人地址: US CA Fremont
- 代理商 Bing K Yen
- 主分类号: G11C13/00
- IPC分类号: G11C13/00
摘要:
The present invention is directed to a method for reading and writing an STT-MRAM multi-level cell (MLC), which includes a plurality of MTJ memory elements coupled in series. The method detects the resistance states of individual MTJ memory elements in an MLC by sequentially writing each memory element to the low resistance state in order of ascending parallelizing write current threshold. If a written element switches the resistance state thereof after the write step, then the written element was in the high resistance state prior to the write step. Otherwise, the written element was in the low resistance state prior to the write step. The switching of the resistance state can be ascertained by comparing the resistance or voltage values of the plurality of memory elements before and after writing each of the plurality of memory elements in accordance with the embodiments of the present invention.
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