Invention Grant
US08815014B2 Method and system for performing different deposition processes within a single chamber
有权
用于在单个室内执行不同沉积工艺的方法和系统
- Patent Title: Method and system for performing different deposition processes within a single chamber
- Patent Title (中): 用于在单个室内执行不同沉积工艺的方法和系统
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Application No.: US13024328Application Date: 2011-02-10
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Publication No.: US08815014B2Publication Date: 2014-08-26
- Inventor: Jacques Faguet , Masahide Iwasaki , Toshihisa Nozawa
- Applicant: Jacques Faguet , Masahide Iwasaki , Toshihisa Nozawa
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: C23C16/00
- IPC: C23C16/00 ; C23F1/00

Abstract:
A method and system for plasma-assisted thin film vapor deposition on a substrate is described. The system includes a process chamber including a first process space having a first volume, a substrate stage coupled to the process chamber and configured to support a substrate and expose the substrate to the first process space, a plasma generation system coupled to the process chamber and configured to generate plasma in at least a portion of the first process space, and a vacuum pumping system coupled to the process chamber and configured to evacuate at least a portion of the first process space. The system further includes a process volume adjustment mechanism coupled to the process chamber and configured to create a second process space that includes at least a part of the first process space and that has a second volume less than the first volume, the substrate being exposed to the second process space.
Public/Granted literature
- US20110135842A1 METHOD AND SYSTEM FOR PERFORMING DIFFERENT DEPOSITION PROCESSES WITHIN A SINGLE CHAMBER Public/Granted day:2011-06-09
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