Invention Grant
- Patent Title: High resolution structured illumination microscopy
- Patent Title (中): 高分辨率结构照明显微镜
-
Application No.: US13146550Application Date: 2010-01-28
-
Publication No.: US08836948B2Publication Date: 2014-09-16
- Inventor: Zhaowei Liu
- Applicant: Zhaowei Liu
- Applicant Address: US CA Oakland
- Assignee: The Regents of the University of California
- Current Assignee: The Regents of the University of California
- Current Assignee Address: US CA Oakland
- Agency: Mintz, Levin, Cohn, Ferris, Glovsky & Popeo, P.C.
- International Application: PCT/US2010/022443 WO 20100128
- International Announcement: WO2010/088418 WO 20100805
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01N21/55 ; G02B27/60 ; G02B5/00 ; G01N21/64 ; G01B11/24 ; G01B9/04 ; G02B21/16

Abstract:
Disclosed are systems, apparatus, methods and devices, including a method that includes generating two or more sequential surface plasmon interference patterns, at least one of the two or more sequential surface plasmon interference patterns being different from another of the two or more sequential surface plasmon interference patterns, and capturing respective images of a specimen resulting from the interference patterns. Also disclosed is a method that includes generating two or more sequential optical interference patterns, at least one of the two or more sequential optical interference patterns being different from another of the interference patterns, and removing from each of the generated interference patterns, using a beam stopper, a corresponding zero-order diffraction light component included in the respective generated patterns to obtain resultant corresponding two or more sequential optical interference patterns, directed at a specimen, with missing respective zero-order light components.
Public/Granted literature
- US20120069344A1 HIGH RESOLUTION STRUCTURED ILLUMINATION MICROSCOPY Public/Granted day:2012-03-22
Information query