Invention Grant
- Patent Title: Sample analyzer and method for controling a sample analyzer
- Patent Title (中): 样品分析仪和样品分析仪的控制方法
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Application No.: US13626257Application Date: 2012-09-25
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Publication No.: US08845964B2Publication Date: 2014-09-30
- Inventor: Daigo Fukuma , Keisuke Kuwano
- Applicant: Sysmex Corporation
- Applicant Address: JP
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP
- Agency: Brinks Gilson & Lione
- Priority: JP2011-211147 20110927
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N21/00 ; G01N35/10 ; G01N35/02 ; G01N35/00 ; G01N33/48

Abstract:
A sample analyzer comprising: a measurement section; a transportation section; an identification data obtainer; and a system controller; is disclosed. The system controller is configured to acquire a result of determination regarding whether a sample needs a re-measurement for a sample based on a result of a measurement of the sample. When the system controller recognizes a presence of the washing fluid tube transported by the transportation section before a determination result regarding a necessity of re-measurement is obtained for an already aspirated sample, the system controller prohibits the supply of the washing fluid in the washing fluid tube to the measurement section.
Public/Granted literature
- US20130079921A1 SAMPLE ANALYZER AND METHOD FOR CONTROLING A SAMPLE ANALYZER Public/Granted day:2013-03-28
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