发明授权
- 专利标题: Packaging structures and methods for semiconductor devices
- 专利标题(中): 半导体器件的封装结构和方法
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申请号: US13554839申请日: 2012-07-20
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公开(公告)号: US08847369B2公开(公告)日: 2014-09-30
- 发明人: Ming-Chih Yew , Wen-Yi Lin , Jiun Yi Wu , Po-Yao Lin
- 申请人: Ming-Chih Yew , Wen-Yi Lin , Jiun Yi Wu , Po-Yao Lin
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater and Matsil, L.L.P.
- 主分类号: H01L23/495
- IPC分类号: H01L23/495 ; H01L23/48 ; H01L23/52 ; H01L29/40 ; H01L21/44 ; H05K1/11 ; H05K3/02 ; H05K3/10
摘要:
Packaging structures and methods for semiconductor devices are disclosed. In one embodiment, a substrate for packaging a semiconductor device includes a core substrate, an insulating material disposed over the core substrate, and conductive lines disposed in the insulating material. Contact pads are disposed over the insulating material and the conductive lines. The contact pads are disposed in an integrated circuit mounting region of the core substrate. A solder mask define (SMD) material is disposed over the insulating material. Portions of the contact pads are exposed through openings in the SMD material. A stress-relief structure (SRS) is disposed in the SMD material proximate the contact pads. The SRS is disposed entirely in the integrated circuit mounting region of the core substrate.
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