发明授权
- 专利标题： Test schemes and apparatus for passive interposers
- 专利标题（中）： 被动中介器的测试方案和设备
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申请号： US13184008申请日： 2011-07-15
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公开(公告)号： US08860448B2公开(公告)日： 2014-10-14
- 发明人: Yun-Han Lee , Mill-Jer Wang , Tan-Li Chou
- 申请人： Yun-Han Lee , Mill-Jer Wang , Tan-Li Chou
- 申请人地址： TW Hsin-Chu
- 专利权人： Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人： Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址： TW Hsin-Chu
- 代理机构： Slater & Matsil, L.L.P.
- 主分类号： G01R31/20
- IPC分类号： G01R31/20 ; G01R1/073
摘要：
A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first pattern, and reconnect the plurality of probe pins in a second pattern different from the first pattern.
公开/授权文献
- US20130015872A1 Test Schemes and Apparatus for Passive Interposers 公开/授权日：2013-01-17
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