Invention Grant
- Patent Title: Zero keeper circuit with full design-for-test coverage
- Patent Title (中): 零保持器电路具有全面的测试覆盖范围
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Application No.: US13725784Application Date: 2012-12-21
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Publication No.: US08860464B2Publication Date: 2014-10-14
- Inventor: Hitesh K Gupta , Greg M Hess , Naveen Javarappa
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel. P.C.
- Main IPC: H03K3/037
- IPC: H03K3/037 ; H03K19/00 ; G11C7/00

Abstract:
A zero keeper circuit includes a dynamic input PFET connected to a source, an output, and a dynamic input. The circuit also includes a clock input NFET connected to the output, a pull-down node, and a clock input. The circuit also includes a dynamic input NFET connected to the pull-down node, a reference voltage, and the dynamic input. The circuit also includes a feedback PFET and a clock input PFET connected in series between the source and the output. The feedback PFET receives a feedback signal and the clock input PFET receives the clock input. The circuit also includes a feedback NFET connected to the output and the node. The feedback NFET is configured to couple the output to the node based on the feedback signal. The circuit also includes a NOR gate configured to provide the feedback signal based on the output and a bypass input.
Public/Granted literature
- US20140177354A1 ZERO KEEPER CIRCUIT WITH FULL DESIGN-FOR-TEST COVERAGE Public/Granted day:2014-06-26
Information query
IPC分类: