Invention Grant
- Patent Title: Memory quality monitor based compensation method and apparatus
- Patent Title (中): 基于内存质量监测的补偿方法和装置
-
Application No.: US13931519Application Date: 2013-06-28
-
Publication No.: US08862969B2Publication Date: 2014-10-14
- Inventor: Bruce A. Liikanen , Gerald L. Cadloni , Larry J. Koudele , John L. Seabury , Stephen P. Van Aken , Guy R. Wagner
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Pritzkau Patent Group, LLC
- Main IPC: H03M13/00
- IPC: H03M13/00 ; H03M13/15 ; G06F11/08 ; H03M13/41 ; G06F11/10 ; H03M13/11 ; H03M13/37 ; G11C11/56

Abstract:
In one embodiment, an encoder reads a set of data from memory cells to obtain retrieved data influenced by one or more distortion mechanisms as a result of having been stored. A quality metric is generated responsive to the retrieved data that changes in value responsive to differences between the user data and the associated retrieved data. A quality monitor establishes a relationship between a current value of the quality metric and a threshold value and monitors the relationship as being indicative of a degradation of the quality of the retrieved data, and selectively initiates an error response. In another embodiment, a correction value is iterated through a set of values as a quality metric is monitored such that the value of the quality metric which most closely approaches the value of the quality metric immediately subsequent to an initial writing of the data can be selected.
Public/Granted literature
- US20130290811A1 MEMORY QUALITY MONITOR BASED COMPENSATION METHOD AND APPARATUS Public/Granted day:2013-10-31
Information query
IPC分类: