Invention Grant
- Patent Title: Optical inspector
- Patent Title (中): 光学检查员
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Application No.: US13757154Application Date: 2013-02-01
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Publication No.: US08896825B2Publication Date: 2014-11-25
- Inventor: Steven W. Meeks , Rusmin Kudinar , Hung P. Nguyen
- Applicant: Steven W. Meeks , Rusmin Kudinar , Hung P. Nguyen
- Applicant Address: US CA San Jose
- Assignee: Zeta Instruments, Inc.
- Current Assignee: Zeta Instruments, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Imperium Patent Works
- Agent Mark D. Marrello
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G02B26/12 ; G02B26/10 ; G01N21/01

Abstract:
An optical inspector includes a radiating source, a time varying beam reflector, a telecentric scan lens, a first and second lens, a field stop, and a detector. The radiating source irradiates a first position of on the time varying beam reflector with a source beam. The time varying beam reflector directs the source beam to the telecentric scan lens, which in turn directs the source beam to a sample. The first lens focuses scattered radiation from the sample to generate multiple scan lines at a first focal plane. The field stop is positioned at the first focal plane to block one or more scan lines at the first focal plane. The scan line not blocked by the field stop propagates to the second lens. The second lens de-scans the scan line and generates a point of scattered radiation at a second focal plane where the detector input is located.
Public/Granted literature
- US20140218722A1 Optical Inspector Public/Granted day:2014-08-07
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