Invention Grant
- Patent Title: Nanomechanical testing system
- Patent Title (中): 纳米力学测试系统
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Application No.: US13962849Application Date: 2013-08-08
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Publication No.: US08959980B2Publication Date: 2015-02-24
- Inventor: David James Vodnick , Arpit Dwivedi , Lucas Paul Keranen , Michael David Okerlund , Roger William Schmitz , Oden Lee Warren , Christopher David Young
- Applicant: Hysitron, Inc.
- Applicant Address: unknown Eden Prairie
- Assignee: Hysitron, Inc.
- Current Assignee: Hysitron, Inc.
- Current Assignee Address: unknown Eden Prairie
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G01Q40/00
- IPC: G01Q40/00 ; G01P21/00 ; G01B21/04 ; G01N3/02 ; G01Q60/36 ; G01N3/42

Abstract:
An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
Public/Granted literature
- US20130319071A1 NANOMECHANICAL TESTING SYSTEM Public/Granted day:2013-12-05
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