公开(公告)号：US09829417B2

公开(公告)日：2017-11-28

申请号：US14407783

申请日：2013-03-14

Applicant: Hysitron, Inc.

Inventor： Roger William Schmitz ,  Ude D. Hangen ,  Lucas Paul Keranen ,  Ryan Major ,  Yunje Oh ,  Jeremiah Vieregge ,  Christopher David Young

IPC: G01N3/42 ,  G01N1/28 ,  G01B3/00 ,  F28F9/26 ,  G01N1/44 ,  G01N19/00 ,  G01N27/14

CPC classification number: G01N1/28 ,  F28F9/26 ,  G01B3/00 ,  G01N1/44 ,  G01N3/42 ,  G01N19/00 ,  G01N27/14

Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.

公开(公告)号：US20150185117A1

公开(公告)日：2015-07-02

申请号：US14407783

申请日：2013-03-14

Applicant: Hysitron, Inc.

Inventor： Roger William Schmitz ,  Ude D. Hangen ,  Lucas Paul Keranen ,  Ryan Major ,  Yunje Oh ,  Jeremiah Vieregge ,  Christopher David Young

IPC: G01N1/28 ,  G01N1/44 ,  G01N19/00 ,  F28F9/26 ,  G01N27/14

CPC classification number: G01N1/28 ,  F28F9/26 ,  G01B3/00 ,  G01N1/44 ,  G01N3/42 ,  G01N19/00 ,  G01N27/14

Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.

Abstract translation: 用于微米或更小尺寸的机械测试的环境调理组件。 组件包括其中具有环境空腔的外壳壳体。 样品台位于环境腔内，并包括一个选件样品加热器。 外壳壳体包括围绕样品台聚集的空腔周边，并且外壳壳体将环境腔和样品台与外壳外部的环境隔离。 在一个示例中，膨胀和收缩连接根据环境空腔内的加热或冷却波动在样品台上保持样品在静态高度。 测试仪器进出口延伸穿过外壳进入环境空腔。

公开(公告)号：US08959980B2

公开(公告)日：2015-02-24

申请号：US13962849

申请日：2013-08-08

Applicant: Hysitron, Inc.

Inventor： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

IPC: G01Q40/00 ,  G01P21/00 ,  G01B21/04 ,  G01N3/02 ,  G01Q60/36 ,  G01N3/42

CPC classification number: G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

Abstract translation: 自动化测试系统包括用机械测试仪器在微（多微米）或更小尺度下对样品进行在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。

公开(公告)号：US08770036B2

公开(公告)日：2014-07-08

申请号：US13962865

申请日：2013-08-08

Applicant: Hysitron, Inc.

Inventor： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

IPC: G01N3/00

CPC classification number: G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

Abstract translation: 自动化测试系统包括用机械测试仪器，以微（多微米）或更小尺度促进样品在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。

公开(公告)号：US20130319127A1

公开(公告)日：2013-12-05

申请号：US13962865

申请日：2013-08-08

Applicant: Hysitron, Inc.

Inventor： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

IPC: G01N3/02

CPC classification number: G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

公开(公告)号：US20130319071A1

公开(公告)日：2013-12-05

申请号：US13962849

申请日：2013-08-08

Applicant: Hysitron, Inc.

Inventor： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

IPC: G01P21/00

CPC classification number: G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

Abstract translation: 自动化测试系统包括用机械测试仪器在微（多微米）或更小尺度下对样品进行在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。