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公开(公告)号：US20160123859A1
公开(公告)日：2016-05-05
申请号：US14948549
申请日：2015-11-23
Applicant: Hysitron, Inc.
Inventor： Yunje Oh , Syed Amanulla Syed Asif , Edward Cyrankowski , Oden Lee Warren
CPC classification number: G01N1/42 , G01N3/08 , G01N3/18 , G01N3/42 , G01N2203/0226 , G01N2203/0286 , G01N2203/04 , G01N2223/418 , H01J37/20 , H05B1/023 , H05B3/06 , H05B3/22
Abstract: A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.
Abstract translation: 一种亚微米级属性测试装置，包括测试对象支架和加热组件。 组件包括构造成与亚微米机械测试仪器和电 - 机械换能器组件联接的保持器基座。 组件还包括与保持器基座联接的测试对象级。 测试对象阶段与保持器基座热隔离。 测试对象阶段包括被配置为接收测试对象的舞台对象表面和支撑舞台对象表面的舞台。 舞台板在舞台主体表面下。 测试对象阶段还包括与舞台对象表面相邻的加热元件，加热元件构造成在舞台对象表面处产生热量。
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公开(公告)号：US08770036B2
公开(公告)日：2014-07-08
申请号：US13962865
申请日：2013-08-08
Applicant: Hysitron, Inc.
Inventor： David James Vodnick , Arpit Dwivedi , Lucas Paul Keranen , Michael David Okerlund , Roger William Schmitz , Oden Lee Warren , Christopher David Young
IPC: G01N3/00
CPC classification number: G01P21/00 , G01B11/27 , G01B21/047 , G01N3/02 , G01N3/42 , G01N19/00 , G01N2203/0082 , G01N2203/0286 , G01Q40/00 , G01Q60/366 , Y10T29/49826
Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
Abstract translation: 自动化测试系统包括用机械测试仪器，以微（多微米）或更小尺度促进样品在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。
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公开(公告)号：US09759641B2
公开(公告)日：2017-09-12
申请号：US14948549
申请日：2015-11-23
Applicant: Hysitron, Inc.
Inventor： Yunje Oh , Syed Amanulla Syed Asif , Edward Cyrankowski , Oden Lee Warren
IPC: H05B3/20 , H05B3/10 , G01N1/42 , H01J37/20 , G01N3/08 , H05B1/02 , H05B3/22 , G01N3/18 , G01N3/42
CPC classification number: G01N1/42 , G01N3/08 , G01N3/18 , G01N3/42 , G01N2203/0226 , G01N2203/0286 , G01N2203/04 , G01N2223/418 , H01J37/20 , H05B1/023 , H05B3/06 , H05B3/22
Abstract: A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.
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Patent Agency Ranking
公开(公告)号：US08959980B2
公开(公告)日：2015-02-24
申请号：US13962849
申请日：2013-08-08
Applicant: Hysitron, Inc.
Inventor： David James Vodnick , Arpit Dwivedi , Lucas Paul Keranen , Michael David Okerlund , Roger William Schmitz , Oden Lee Warren , Christopher David Young
CPC classification number: G01P21/00 , G01B11/27 , G01B21/047 , G01N3/02 , G01N3/42 , G01N19/00 , G01N2203/0082 , G01N2203/0286 , G01Q40/00 , G01Q60/366 , Y10T29/49826
Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
Abstract translation: 自动化测试系统包括用机械测试仪器在微（多微米）或更小尺度下对样品进行在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。
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公开(公告)号：US20150033835A1
公开(公告)日：2015-02-05
申请号：US14361133
申请日：2012-11-28
Applicant: Hysitron, Inc.
Inventor： Syed Amanulla Syed Asif , Edward Cyrankowski , Lucas Paul Keranen , Ryan Major , Yunjie Oh , Oden Lee Warren
CPC classification number: G01N3/54 , G01N3/08 , G01N3/18 , G01N2203/0078 , G01N2203/0226 , G01N2203/0282 , G01N2203/0286 , G01N2203/0482 , H05B1/023 , H05B3/32
Abstract: A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.
Abstract translation: 用于微米或更小尺度的机械测试的加热系统包括级加热器。 舞台加热器具有舞台平面，舞台加热元件分布在舞台平面上。 在舞台平面的相对两侧有两个或多个支撑座。 第一桥从舞台平面延伸到两个或更多个支撑座的第一安装座，并且第二桥从舞台平面延伸到两个或更多个支撑座的第二安装座。 第一和第二桥梁在台面平面和两个或更多个支撑架之间提供多个支撑件，以相应地支撑台面平面。 在另一示例中，加热系统包括配置成加热探针作为机械测试的一部分的探针加热器。
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公开(公告)号：US09804072B2
公开(公告)日：2017-10-31
申请号：US14361133
申请日：2012-11-28
Applicant: Hysitron, Inc.
Inventor： Syed Amanulla Syed Asif , Edward Cyrankowski , Lucas Paul Keranen , Ryan Major , Yunje Oh , Oden Lee Warren , Maciej W. Misiak
CPC classification number: G01N3/54 , G01N3/08 , G01N3/18 , G01N2203/0078 , G01N2203/0226 , G01N2203/0282 , G01N2203/0286 , G01N2203/0482 , H05B1/023 , H05B3/32
Abstract: A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.
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公开(公告)号：US20130319127A1
公开(公告)日：2013-12-05
申请号：US13962865
申请日：2013-08-08
Applicant: Hysitron, Inc.
Inventor： David James Vodnick , Arpit Dwivedi , Lucas Paul Keranen , Michael David Okerlund , Roger William Schmitz , Oden Lee Warren , Christopher David Young
IPC: G01N3/02
CPC classification number: G01P21/00 , G01B11/27 , G01B21/047 , G01N3/02 , G01N3/42 , G01N19/00 , G01N2203/0082 , G01N2203/0286 , G01Q40/00 , G01Q60/366 , Y10T29/49826
Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
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公开(公告)号：US20130319071A1
公开(公告)日：2013-12-05
申请号：US13962849
申请日：2013-08-08
Applicant: Hysitron, Inc.
Inventor： David James Vodnick , Arpit Dwivedi , Lucas Paul Keranen , Michael David Okerlund , Roger William Schmitz , Oden Lee Warren , Christopher David Young
IPC: G01P21/00
CPC classification number: G01P21/00 , G01B11/27 , G01B21/047 , G01N3/02 , G01N3/42 , G01N19/00 , G01N2203/0082 , G01N2203/0286 , G01Q40/00 , G01Q60/366 , Y10T29/49826
Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
Abstract translation: 自动化测试系统包括用机械测试仪器在微（多微米）或更小尺度下对样品进行在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。
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