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    Nanomechanical testing system
    1.
    发明授权
    Nanomechanical testing system 有权
    纳米力学测试系统

    公开(公告)号：US08959980B2

    公开(公告)日：2015-02-24

    申请号：US13962849

    申请日：2013-08-08

    Applicant: Hysitron, Inc.

    Inventor： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

    IPC: G01Q40/00 ,  G01P21/00 ,  G01B21/04 ,  G01N3/02 ,  G01Q60/36 ,  G01N3/42

    CPC classification number: G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

    Abstract translation: 自动化测试系统包括用机械测试仪器在微（多微米）或更小尺度下对样品进行在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。

    Nanomechanical testing system
    2.
    发明授权
    Nanomechanical testing system 有权
    纳米力学测试系统

    公开(公告)号：US08770036B2

    公开(公告)日：2014-07-08

    申请号：US13962865

    申请日：2013-08-08

    Applicant: Hysitron, Inc.

    Inventor： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

    IPC: G01N3/00

    CPC classification number: G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

    Abstract translation: 自动化测试系统包括用机械测试仪器，以微（多微米）或更小尺度促进样品在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。

    NANOMECHANICAL TESTING SYSTEM
    4.
    发明申请
    NANOMECHANICAL TESTING SYSTEM 有权
    南方测试系统

    公开(公告)号：US20130319071A1

    公开(公告)日：2013-12-05

    申请号：US13962849

    申请日：2013-08-08

    Applicant: Hysitron, Inc.

    Inventor： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

    IPC: G01P21/00

    CPC classification number: G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

    Abstract translation: 自动化测试系统包括用机械测试仪器在微（多微米）或更小尺度下对样品进行在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。

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