发明授权
- 专利标题: Electronic device and noise current measuring method
- 专利标题(中): 电子设备和噪声电流测量方法
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申请号: US13375742申请日: 2010-05-26
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公开(公告)号: US08981790B2公开(公告)日: 2015-03-17
- 发明人: Satoshi Nakamura , Takashi Suga , Yutaka Uematsu
- 申请人: Satoshi Nakamura , Takashi Suga , Yutaka Uematsu
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Crowell & Moring LLP
- 优先权: JP2009-134139 20090603
- 国际申请: PCT/JP2010/003518 WO 20100526
- 国际公布: WO2010/140318 WO 20101209
- 主分类号: G01R29/26
- IPC分类号: G01R29/26 ; G01R31/08 ; G01R31/00 ; G01R31/28 ; H05K9/00 ; H05K1/02 ; H05K1/14 ; H05K3/32
摘要:
A noise current passing through a substrate on which an electronic component is mounted is suppressed in a housing, to provide a malfunction of an electronic device. A substrate (103) on which an electronic component is mounted is secured to a housing (102) by a metal spacer (108) and a screw (104). A noise control member (100) mainly composed of an insulation substance is disposed between the metal spacer (108) and the substrate (103). A first conductive film is formed on the metal spacer-side of the noise control member (100), and a second conductive film is formed on the substrate-side of the noise control member (100). A resistance member (101) is disposed between the first conductive film and the second conductive film. A noise current introduced from the housing to the substrate can be suppressed by the resistance member.
公开/授权文献
- US20120119757A1 Electronic Device and Noise Current Measuring Method 公开/授权日:2012-05-17
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