发明授权
- 专利标题: Calibration in multiple slope column parallel analog-to-digital conversion for image sensors
- 专利标题(中): 用于图像传感器的多斜率列并行模数转换的校准
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申请号: US14573978申请日: 2014-12-17
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公开(公告)号: US08994832B1公开(公告)日: 2015-03-31
- 发明人: Zheng Yang , Guangbin Zhang , Yuanbao Gu
- 申请人: OmniVision Technologies, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: OmniVision Technologies, Inc.
- 当前专利权人: OmniVision Technologies, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely Sokoloff Taylor & Zafman LLP
- 主分类号: H04N5/378
- IPC分类号: H04N5/378 ; H03M1/10 ; H03M1/56 ; H04N5/369 ; H04N5/357 ; H04N5/217 ; H04N5/3745
摘要:
An apparatus includes analog-to-digital (A/D) conversion circuitry coupled to a pixel array. The A/D conversion circuitry includes a voltage ramp generator and a set of column A/D conversion circuits. The voltage ramp generator generates a single slope voltage ramp in a first state and a multiple slope voltage ramp in a second state. The set of column A/D conversion circuits is coupled with the voltage ramp generator. The apparatus further includes calibration circuitry coupled with the set of column A/D conversion circuits and operable to determine digital calibration data to adjust digital image data. The calibration circuitry provides analog calibration data that spans a calibration range to the set of column A/D conversion circuits instead of the analog image data from the pixel array being provided to the set of column A/D conversion circuits.
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