发明授权
US08994832B1 Calibration in multiple slope column parallel analog-to-digital conversion for image sensors 有权
用于图像传感器的多斜率列并行模数转换的校准

Calibration in multiple slope column parallel analog-to-digital conversion for image sensors
摘要:
An apparatus includes analog-to-digital (A/D) conversion circuitry coupled to a pixel array. The A/D conversion circuitry includes a voltage ramp generator and a set of column A/D conversion circuits. The voltage ramp generator generates a single slope voltage ramp in a first state and a multiple slope voltage ramp in a second state. The set of column A/D conversion circuits is coupled with the voltage ramp generator. The apparatus further includes calibration circuitry coupled with the set of column A/D conversion circuits and operable to determine digital calibration data to adjust digital image data. The calibration circuitry provides analog calibration data that spans a calibration range to the set of column A/D conversion circuits instead of the analog image data from the pixel array being provided to the set of column A/D conversion circuits.
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