发明授权
- 专利标题: Memory subsystem command bus stress testing
- 专利标题(中): 内存子系统命令总线压力测试
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申请号: US13706196申请日: 2012-12-05
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公开(公告)号: US09009540B2公开(公告)日: 2015-04-14
- 发明人: Christopher P. Mozak , Theodore Z. Schoenborn , James M. Shehadi , David G. Ellis , Tomer Levy , Zvika Greenfield
- 申请人: Christopher P. Mozak , Theodore Z. Schoenborn , James M. Shehadi , David G. Ellis , Tomer Levy , Zvika Greenfield
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: G06F11/00
- IPC分类号: G06F11/00 ; G06F11/263 ; G11C29/02 ; G11C29/06 ; G11C29/52
摘要:
A memory subsystem includes logic buffer coupled to a command bus between a memory controller and a memory device. The logic buffer detects that the memory controller places the command bus in a state where the memory controller does not drive the command bus with a valid executable memory device command. In response to detecting the state of the command bus, the logic buffer generates a signal pattern and injects the signal pattern on the command bus after a scheduler of the memory controller to drive the command bus with the signal pattern.
公开/授权文献
- US20140157055A1 MEMORY SUBSYSTEM COMMAND BUS STRESS TESTING 公开/授权日:2014-06-05
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