发明授权
US09009540B2 Memory subsystem command bus stress testing 有权
内存子系统命令总线压力测试

Memory subsystem command bus stress testing
摘要:
A memory subsystem includes logic buffer coupled to a command bus between a memory controller and a memory device. The logic buffer detects that the memory controller places the command bus in a state where the memory controller does not drive the command bus with a valid executable memory device command. In response to detecting the state of the command bus, the logic buffer generates a signal pattern and injects the signal pattern on the command bus after a scheduler of the memory controller to drive the command bus with the signal pattern.
公开/授权文献
信息查询
0/0