Invention Grant
- Patent Title: Apparatuses and methods for atomic layer deposition
- Patent Title (中): 用于原子层沉积的装置和方法
-
Application No.: US13625229Application Date: 2012-09-24
-
Publication No.: US09017776B2Publication Date: 2015-04-28
- Inventor: Hyman W. H. Lam , Bo Zheng , Hua Ai , Michael Jackson , Xiaoxiong Yuan , Hou Gong Wang , Salvador P. Umotoy , Sang Ho Yu
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: H05H1/24
- IPC: H05H1/24 ; C23C16/44 ; C23C16/455 ; H01J37/32 ; C23C16/00

Abstract:
Embodiments of the invention provide apparatuses and methods for atomic layer deposition (ALD), such as plasma-enhanced ALD (PE-ALD). In some embodiments, a PE-ALD chamber is provided which includes a chamber lid assembly coupled with a chamber body having a substrate support therein. In one embodiment, the chamber lid assembly has an inlet manifold assembly containing an annular channel encompassing a centralized channel, wherein the centralized channel extends through the inlet manifold assembly, and the inlet manifold assembly further contains injection holes extending from the annular channel, through a sidewall of the centralized channel, and to the centralized channel. The chamber lid assembly further contains a showerhead assembly disposed below the inlet manifold assembly, a water box disposed between the inlet manifold assembly and the showerhead assembly, and a remote plasma system (RPS) disposed above and coupled with the inlet manifold assembly, and in fluid communication with the centralized channel.
Public/Granted literature
- US20140087091A1 APPARATUSES AND METHODS FOR ATOMIC LAYER DEPOSITION Public/Granted day:2014-03-27
Information query
IPC分类: