Invention Grant
US09048057B2 Electron gun emitting under high voltage, in particular for electron microscopy
有权
电子枪在高电压下发射，特别是电子显微镜
- Patent Title: Electron gun emitting under high voltage, in particular for electron microscopy
- Patent Title (中): 电子枪在高电压下发射，特别是电子显微镜
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Application No.: US13823506Application Date: 2011-09-16
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Publication No.: US09048057B2Publication Date: 2015-06-02
- Inventor: Marc Monthioux , Florent Houdellier
- Applicant: Marc Monthioux , Florent Houdellier
- Applicant Address: FR Paris
- Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS)
- Current Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS)
- Current Assignee Address: FR Paris
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR1003696 20100917
- International Application: PCT/FR2011/052135 WO 20110916
- International Announcement: WO2012/035277 WO 20120322
- Main IPC: H01J29/48
- IPC: H01J29/48 ; H01J1/304 ; H01J3/02 ; H01J37/073 ; H01J37/28 ; H01J9/02 ; B82Y20/00
Abstract:
A field-emission electron gun including an electron emission tip, an extractor anode, and a mechanism creating an electric-potential difference between the emission tip and the extractor anode. The emission tip includes a metal tip and an end cone produced by chemical vapor deposition on a nanofilament, the cone being aligned and welded onto the metal tip. The electron gun can be used for a transmission electron microscope.
Public/Granted literature
- US20130234025A1 ELECTRON GUN EMITTING UNDER HIGH VOLTAGE, IN PARTICULAR FOR ELECTRON MICROSCOPY Public/Granted day:2013-09-12
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