发明授权
- 专利标题: Liquid chemical for forming water repellent protective film
- 专利标题(中): 用于形成防水保护膜的液体化学品
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申请号: US13703593申请日: 2011-06-15
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公开(公告)号: US09090782B2公开(公告)日: 2015-07-28
- 发明人: Takashi Saio , Soichi Kumon , Masanori Saito , Shinobu Arata , Hidehisa Nanai
- 申请人: Takashi Saio , Soichi Kumon , Masanori Saito , Shinobu Arata , Hidehisa Nanai
- 申请人地址: JP Ube-shi
- 专利权人: Central Glass Company, Limited
- 当前专利权人: Central Glass Company, Limited
- 当前专利权人地址: JP Ube-shi
- 代理机构: Crowell & Moring LLP
- 优先权: JP2010-149596 20100630; JP2011-108323 20110513
- 国际申请: PCT/JP2011/063634 WO 20110615
- 国际公布: WO2012/002145 WO 20120105
- 主分类号: C09D7/12
- IPC分类号: C09D7/12 ; H01L21/02 ; H01L21/306 ; H01L21/3105 ; C07F7/10 ; C07F7/12
摘要:
The present invention relates to a method for cleaning wafers while preventing pattern collapse of the wafers in semiconductor device fabrication, the wafer having at its surface an uneven pattern and containing silicon element at least on surfaces of recessed portions. Provided is: a liquid chemical for forming a protective film which allows efficient cleaning; and a method for cleaning wafers, using the liquid chemical. A liquid chemical for forming a water repellent protective film is provided for forming a protective film on a wafer (having at its surface an uneven pattern and containing silicon element at least at a part of the uneven pattern), the protective film being formed at least on surfaces of recessed portions of the uneven pattern at the time of cleaning the wafer. The liquid chemical contains a dialkylsilyl compound represented by the formula [1] and does not contain an acid and a base. R2(H)SiX [1]
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