Invention Grant
- Patent Title: Image-based refractive index measuring system
- Patent Title (中): 基于图像的折射率测量系统
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Application No.: US13836991Application Date: 2013-03-15
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Publication No.: US09103778B2Publication Date: 2015-08-11
- Inventor: Tai-Shan Liao , Chi-Hung Huang , Chih-Chieh Wu , Din Ping Tsai , Shih-Jie Chou , Cheng-Fang Ho
- Applicant: NATIONAL APPLIED RESEARCH LABORATORIES
- Applicant Address: TW Taipei
- Assignee: National Applied Research Laboratories
- Current Assignee: National Applied Research Laboratories
- Current Assignee Address: TW Taipei
- Agency: Wang Law Firm, Inc.
- Agent Li K. Wang; Stephen Hsu
- Priority: TW102100988A 20130110
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G06K9/00 ; G01N21/43

Abstract:
An image-based refractive index measuring system comprises an optical device and an electronic device. The optical device is used to guiding an external light which is passed through an analyte. The electronic device comprises an image capture module, an image analyze module and a display module. The image capture module generates a first image by capturing the external light source. The image analyze module connects to the image capture module to receive the first image, and analyzes the first image in order to generate an analytical result comprising the refractive index of the analyte. The display module connects to the image analyze module to receive and display the analytical result.
Public/Granted literature
- US20140192183A1 IMAGE-BASED DIOPTER MEASURING SYSTEM Public/Granted day:2014-07-10
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