Invention Grant
- Patent Title: Optical measuring system and optical measuring device thereof
- Patent Title (中): 光学测量系统及其光学测量装置
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Application No.: US14026947Application Date: 2013-09-13
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Publication No.: US09127979B2Publication Date: 2015-09-08
- Inventor: Chen-Chin Cheng , Jian-Shian Lin , Min-Chieh Chou , Yu-Tang Chen
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Locke Lord LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: TW101133839A 20120914
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G01J1/02 ; G01J1/42

Abstract:
An optical measuring device includes a case, a reflective layer and a light collecting lens module. A measuring chamber and a channel, which is connected to the measuring chamber and is connected to an opening of the case, reside in the case. The reflective layer is disposed onto an inner surface of the measuring chamber. The light collecting lens module is located inside the channel. A light beam emits into the channel of the optical measuring device through an opening, passes through the light collecting lens module and enters the measuring chamber afterward.
Public/Granted literature
- US20140078496A1 Optical Measuring System and Optical Measuring Device Thereof Public/Granted day:2014-03-20
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