发明授权
- 专利标题: Electrical circuit testing
- 专利标题(中): 电路测试
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申请号: US13853525申请日: 2013-03-29
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公开(公告)号: US09128119B2公开(公告)日: 2015-09-08
- 发明人: Waleed M. Said
- 申请人: HAMILTON SUNDSTRAND CORPORATION
- 申请人地址: US CT Windsor Locks
- 专利权人: Hamilton Sundstrand Corporation
- 当前专利权人: Hamilton Sundstrand Corporation
- 当前专利权人地址: US CT Windsor Locks
- 代理机构: Cantor Colburn LLP
- 主分类号: G01R1/04
- IPC分类号: G01R1/04 ; G01R31/12 ; G01R31/00 ; G01R31/20
摘要:
An electronics system module includes a primary electrical circuit including input connectors and output connectors and a filter circuit connected between the primary electrical circuit and ground. The module also includes a switch element connected between the primary electrical circuit and ground. The switch element is configured to be engaged by a test connector to open the switch to disconnect the primary electrical circuit from ground. The test connector includes electrical connectors configured to connect to the input connectors and the output connectors of the primary electrical circuit. The switch element is configured to automatically close based on the test connector being disengaged from the switch element.
公开/授权文献
- US20140292365A1 ELECTRICAL CIRCUIT TESTING 公开/授权日:2014-10-02
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