Invention Grant
US09134603B2 Photomask for exposure and method of manufacturing pattern using the same 有权
用于曝光的光掩模和使用其的制造图案的方法

Photomask for exposure and method of manufacturing pattern using the same
Abstract:
A photomask for exposure includes: a transparent substrate; a light blocking pattern layer positioned on the transparent substrate; a first dielectric layer positioned on the light blocking pattern layer and including a dielectric material; and a negative refractive index layer positioned on the first dielectric layer and including a metal. A surface plasmon quasi-bound mode of the photomask for exposure overlaps a wavelength range of the light source of the light exposer which irradiates light to the photomask for exposure.
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