Invention Grant
US09134603B2 Photomask for exposure and method of manufacturing pattern using the same
有权
用于曝光的光掩模和使用其的制造图案的方法
- Patent Title: Photomask for exposure and method of manufacturing pattern using the same
- Patent Title (中): 用于曝光的光掩模和使用其的制造图案的方法
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Application No.: US13856477Application Date: 2013-04-04
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Publication No.: US09134603B2Publication Date: 2015-09-15
- Inventor: Min Kang , Bong-Yeon Kim , Jeong Won Kim , Hyang-Shik Kong , Jin Ho Ju , Kyoung Sik Kim , Seung Hwa Baek , Jun Hyuk Woo , Hyun Joo Lee
- Applicant: Samsung Display Co., Ltd. , Industry-Academic Cooperation Foundation, Yonsei University
- Applicant Address: KR KR
- Assignee: SAMSUNG DISPLAY CO., LTD.,INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Current Assignee: SAMSUNG DISPLAY CO., LTD.,INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Current Assignee Address: KR KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2012-0124718 20121106
- Main IPC: G03F1/38
- IPC: G03F1/38

Abstract:
A photomask for exposure includes: a transparent substrate; a light blocking pattern layer positioned on the transparent substrate; a first dielectric layer positioned on the light blocking pattern layer and including a dielectric material; and a negative refractive index layer positioned on the first dielectric layer and including a metal. A surface plasmon quasi-bound mode of the photomask for exposure overlaps a wavelength range of the light source of the light exposer which irradiates light to the photomask for exposure.
Public/Granted literature
- US20140127612A1 PHOTOMASK FOR EXPOSURE AND METHOD OF MANUFACTURING PATTERN USING THE SAME Public/Granted day:2014-05-08
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