发明授权
- 专利标题: Substrate interconnections having different sizes
- 专利标题(中): 具有不同尺寸的基板互连
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申请号: US12784266申请日: 2010-05-20
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公开(公告)号: US09142533B2公开(公告)日: 2015-09-22
- 发明人: Wen-Wei Shen , Ying-Ching Shih , Chen-Shien Chen , Ming-Fa Chen
- 申请人: Wen-Wei Shen , Ying-Ching Shih , Chen-Shien Chen , Ming-Fa Chen
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L25/065
- IPC分类号: H01L25/065 ; H01L25/00 ; H01L23/498 ; H01L23/31 ; H01L23/00
摘要:
A bump structure that may be used to interconnect one substrate to another substrate is provided. A conductive pillar is formed on a first substrate such that the conductive pillar has a width different than a contact surface on a second substrate. In an embodiment the conductive pillar of the first substrate has a trapezoidal shape or a shape having tapered sidewalls, thereby providing a conductive pillar having base portion wider than a tip portion. The substrates may each be an integrated circuit die, an interposer, a printed circuit board, a high-density interconnect, or the like.
公开/授权文献
- US20110285023A1 Substrate Interconnections having Different Sizes 公开/授权日:2011-11-24
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