Invention Grant
US09159661B2 Integrated circuits with close electrical contacts and methods for fabricating the same 有权
具有紧密电接点的集成电路及其制造方法

Integrated circuits with close electrical contacts and methods for fabricating the same
Abstract:
Integrated circuits with close electrical contacts and methods for fabricating such integrated circuits are provided. The method includes forming a first and a second contact in an interlayer dielectric, and forming a recess between the first and second contact. A etch mask is formed overlying the interlayer dielectric, and the etch mask is removed from over a recess mid-point. A center contact is formed in the interlayer dielectric at the recess mid-point.
Information query
Patent Agency Ranking
0/0