Invention Grant
- Patent Title: Gap measurement device
- Patent Title (中): 间隙测量装置
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Application No.: US14279313Application Date: 2014-05-15
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Publication No.: US09163934B2Publication Date: 2015-10-20
- Inventor: Hideki Hirabayashi , Hiroki Hanaoka , Satoshi Kiyono
- Applicant: Harmonic Drive Systems Inc. , Satoshi Kiyono
- Applicant Address: JP Tokyo JP Miyagi
- Assignee: HARMONIC DRIVE SYSTEMS INC.,Satoshi Kiyono
- Current Assignee: HARMONIC DRIVE SYSTEMS INC.,Satoshi Kiyono
- Current Assignee Address: JP Tokyo JP Miyagi
- Priority: JP2013-108223 20130522
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B11/14 ; G01B11/08 ; G01B11/10

Abstract:
A gap measurement device 1 comprises a light source 5 for projecting light on a gap 3 to be measured, a lens optical system 6 for focusing on an imaging surface 7 a gap image 3A from light transmitted through the gap 3, and a light-receiving element 9 for receiving light of the gap image 3A formed on the imaging surface 7 of the lens optical system 6. A holed mask 8 provided with a light-transmitting hole 8a having a prescribed aperture size is arranged on the imaging surface 7, and the light-receiving element 9 receives the light of the gap image 3A via the hole 8a. A gap size at a point to be measured in an extended gap 3 can be measured by forming an image of the gap with the lens optical system 6 and placing the hole 8a of the holed mask 8 on the point to be measured on the imaging surface 7 of the lens optical system 6.
Public/Granted literature
- US20140347679A1 GAP MEASUREMENT DEVICE Public/Granted day:2014-11-27
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