Invention Grant
- Patent Title: Semiconductor process
- Patent Title (中): 半导体工艺
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Application No.: US14583122Application Date: 2014-12-25
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Publication No.: US09165997B2Publication Date: 2015-10-20
- Inventor: Chieh-Te Chen , Yi-Po Lin , Jiunn-Hsiung Liao , Shui-Yen Lu , Li-Chiang Chen
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L21/332 ; H01L49/02 ; H01L27/06 ; H01L21/768 ; H01L29/66

Abstract:
A semiconductor structure includes a substrate, a resist layer, a dielectric material, two U-shaped metal layers and two metals. The substrate has an isolation structure. The resist layer is located on the isolation structure. The dielectric material is located on the resist layer. Two U-shaped metal layers are located at the two sides of the dielectric material and on the resist layer. Two metals are respectively located on the two U-shaped metal layers. This way a semiconductor process for forming said semiconductor structure is provided.
Public/Granted literature
- US20150126015A1 SEMICONDUCTOR PROCESS Public/Granted day:2015-05-07
Information query
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