Invention Grant
- Patent Title: Resistive memory device and method of operating the same
- Patent Title (中): 电阻式存储器件及其操作方法
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Application No.: US14685671Application Date: 2015-04-14
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Publication No.: US09183932B1Publication Date: 2015-11-10
- Inventor: Hyo-Jin Kwon , Yeong-Taek Lee , Dae-Seok Byeon , Yong-Kyu Lee , Hyun-Kook Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0089274 20140715
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00

Abstract:
A resistive memory device including multiple resistive memory cells arranged in regions where first signal lines and second signal lines cross each other, and a method of operating the resistive memory device, are provided. The method includes applying a first voltage to a first line, from among unselected first signal lines connected to unselected memory cells, that is not adjacent to a selected first signal line connected to a selected memory cell from among the multiple memory cells; applying a second voltage that is lower than the first voltage to a second line, from among the unselected first signal lines, that is adjacent to the selected first signal line; floating the unselected first signal lines; and applying a third voltage that is higher than the first voltage to the selected first signal line.
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