Invention Grant
- Patent Title: Vertical memory devices and methods of manufacturing the same
- Patent Title (中): 垂直存储器件及其制造方法
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Application No.: US14564364Application Date: 2014-12-09
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Publication No.: US09184178B2Publication Date: 2015-11-10
- Inventor: Kyung-Tae Jang , Myoung-Bum Lee , Ji-Youn Seo , Chang-Won Lee , Yong-Chae Jung , Woong-Hee Sohn
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2012-0101471 20120913
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L27/115 ; H01L29/792 ; H01L29/66

Abstract:
A semiconductor device includes a substrate, a plurality of insulating layers vertically stacked on the substrate, a plurality of channels arranged in vertical openings formed through at least some of the plurality of insulating layers, and a plurality of portions alternatingly positioned with the plurality of insulating layers in the vertical direction. At least some of the portions are adjacent corresponding channels of the plurality of channels. Each of the portions includes a conductive barrier pattern formed on an inner wall of the portion, a filling layer pattern positioned in the portion on the conductive barrier pattern, and a gate electrode positioned in a remaining area of the portion not occupied by the conductive barrier or filling layer pattern.
Public/Granted literature
- US20150091078A1 VERTICAL MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME Public/Granted day:2015-04-02
Information query
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