Invention Grant
US09209261B2 Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions
有权
在电连接处去除半导体的费米能级的方法以及包含这种结的装置的方法
- Patent Title: Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions
- Patent Title (中): 在电连接处去除半导体的费米能级的方法以及包含这种结的装置的方法
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Application No.: US14743916Application Date: 2015-06-18
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Publication No.: US09209261B2Publication Date: 2015-12-08
- Inventor: Daniel E. Grupp , Daniel J. Connelly
- Applicant: Acorn Technologies, Inc.
- Applicant Address: US CA Santa Monica
- Assignee: Acorn Technologies, Inc.
- Current Assignee: Acorn Technologies, Inc.
- Current Assignee Address: US CA Santa Monica
- Agency: Ascenda Law Group, PC
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/82 ; H01L29/45 ; H01L29/16 ; H01L29/161 ; H01L29/47 ; H01L29/78 ; H01L29/08

Abstract:
An electrical device in which an interface layer is disposed in between and in contact with a conductor and a semiconductor.
Public/Granted literature
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