Invention Grant
- Patent Title: Variable resistance memory device and a variable resistance memory system including the same
- Patent Title (中): 可变电阻存储器件和包括其的可变电阻存储器系统
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Application No.: US14257391Application Date: 2014-04-21
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Publication No.: US09230642B2Publication Date: 2016-01-05
- Inventor: Kyung-chang Ryoo , Hongsik Jeong , Daehwan Kang , JaeHee Oh , Jihyung Yu
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2013-0093200 20130806
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G11C14/00 ; H01L45/00 ; H01L27/22 ; H01L27/24

Abstract:
A variable resistance memory system includes a variable resistance memory device including a memory cell array including first and second areas; and a memory controller configured to control the variable resistance memory device. The first area includes first variable resistance memory cells including a first variable resistance material layer and the second area includes second variable resistance memory cells including a second variable resistance material layer having a metallic doping concentration higher than a metallic doping concentration of the first variable resistance material layer. The first variable resistance memory cells are used as storage and the second variable resistance memory cells are used as a buffer memory.
Public/Granted literature
- US20150043267A1 VARIABLE RESISTANCE MEMORY DEVICE AND A VARIABLE RESISTANCE MEMORY SYSTEM INCLUDING THE SAME Public/Granted day:2015-02-12
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