Invention Grant
- Patent Title: Semiconductor device and write method
- Patent Title (中): 半导体器件和写入方式
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Application No.: US14495775Application Date: 2014-09-24
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Publication No.: US09236123B2Publication Date: 2016-01-12
- Inventor: Akiko Maeda , Shuichi Tsukada , Yusuke Jono
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Priority: JP2013-198184 20130925
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G11C7/04 ; G11C16/20 ; G11C29/00

Abstract:
A semiconductor device includes a memory cell array including a plurality of first and second memory cells each comprising a variable resistance element that establishes an electrical resistance that changes in response to an application of a write voltage after a forming voltage has been applied, the first memory cell to which the forming voltage is applied, and the second memory cell to which the forming voltage is not applied, and the second memory cell being configured to store one of first and second logic values constituting first information, the first and second logic values being different from each other.
Public/Granted literature
- US20150085561A1 SEMICONDUCTOR DEVICE AND WRITE METHOD Public/Granted day:2015-03-26
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