Invention Grant
- Patent Title: Semiconductor device including through via structures and redistribution structures
- Patent Title (中): 半导体器件包括通孔结构和再分布结构
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Application No.: US13943828Application Date: 2013-07-17
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Publication No.: US09236349B2Publication Date: 2016-01-12
- Inventor: Kyu-Ha Lee , Pil-Kyu Kang , Tae-Yeong Kim , Ho-Jin Lee , Byung-Lyul Park , Gil-Heyun Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2012-0090952 20120820
- Main IPC: H01L23/538
- IPC: H01L23/538 ; H01L23/485 ; H01L23/48 ; H01L23/00 ; H01L21/683 ; H01L21/768 ; H01L23/525 ; H01L23/532

Abstract:
Semiconductor device including through via structure and redistribution structures is provided. The semiconductor device may include internal circuits on a first side of a substrate, a through via structure vertically penetrating the substrate to be electrically connected to one of the internal circuits, a redistribution structure on a second side of the substrate and electrically connected to the through via structure, and an insulating layer between the second side of the substrate and the redistribution structure. The redistribution structure may include a redistribution barrier layer and a redistribution metal layer, and the redistribution barrier layer may extend on a bottom surface of the redistribution metal layer and may partially surround a side of the redistribution metal layer.
Public/Granted literature
- US20140048952A1 SEMICONDUCTOR DEVICE INCLUDING THROUGH VIA STRUCTURES AND REDISTRIBUTION STRUCTURES Public/Granted day:2014-02-20
Information query
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