Invention Grant
- Patent Title: Testing of integrated circuits with external clearance requirements
- Patent Title (中): 具有外部间隙要求的集成电路测试
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Application No.: US13922428Application Date: 2013-06-20
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Publication No.: US09239353B2Publication Date: 2016-01-19
- Inventor: John Paul Tellkamp
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Steven A. Shaw; Frank D. Cimino
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/12 ; G01R31/28
Abstract:
A method of testing an integrated circuit clearance distance device (“ICCDD”) having a predetermined clearance distance in air requirement and a predetermined isolation voltage limit including calculating a value of the breakdown voltage at the predetermined clearance distance for at least one gas; and selecting a gas in which the ICCDD has a breakdown voltage that is less than the predetermined isolation voltage.
Public/Granted literature
- US20140375350A1 TESTING OF INTEGRATED CIRCUITS WITH EXTERNAL CLEARANCE REQUIREMENTS Public/Granted day:2014-12-25
Information query
