发明授权
- 专利标题: Semiconductor memory device executing a write operation with first and second voltage applications
- 专利标题(中): 半导体存储器件利用第一和第二电压应用执行写操作
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申请号: US14118703申请日: 2012-03-09
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公开(公告)号: US09245621B2公开(公告)日: 2016-01-26
- 发明人: Jun Deguchi , Haruki Toda
- 申请人: Jun Deguchi , Haruki Toda
- 申请人地址: JP Tokyo
- 专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2011-117555 20110526
- 国际申请: PCT/JP2012/056788 WO 20120309
- 国际公布: WO2012/160863 WO 20121129
- 主分类号: G11C11/00
- IPC分类号: G11C11/00 ; G11C13/00
摘要:
A semiconductor memory device comprises a memory cell array including plural memory cells provided at the intersections of plural first lines and plural second lines; and a write circuit. The write circuit, on execution of a write operation, executes a first step of applying a voltage across the first and second lines connected to a data-write-targeted, selected memory cell, and a different voltage across the first and second lines connected to a data-write-untargeted, unselected memory cell of the plural memory cells and, after execution of the first step, executes a second step of applying a voltage, required for data write, across the first and second lines connected to the selected memory cell, and bringing at least one of the first and second lines connected to the unselected memory cell into the floating state.
公开/授权文献
- US20140104930A1 SEMICONDUCTOR MEMORY DEVICE 公开/授权日:2014-04-17
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