Invention Grant
- Patent Title: Dual edge-triggered retention flip-flop
- Patent Title (中): 双边沿触发保持触发器
-
Application No.: US14468343Application Date: 2014-08-26
-
Publication No.: US09276566B2Publication Date: 2016-03-01
- Inventor: Vipul Kumar Singhal
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; Frank D. Cimino
- Main IPC: H03K3/289
- IPC: H03K3/289 ; H03K3/037 ; H03K19/00

Abstract:
A dual edge triggered retention flip-flop reduces clock tree power dissipation in an active mode and leakage power in a low-power (e.g., standby) mode. For example, a first latch can be used to latch a first state of an input to a flip-flop in response to a first (e.g., positive-going) edge of a clock signal and a second latch can be used to latch a second state of the input to the flip-flop in response to a second (e.g., negative-going) edge of a clock signal. A retention latch can be used to latch and retain the state of the flip-flop when the first and second latches are disabled to save power in the low-power mode. The retention latch can also be used to initialize at least one of the first and second flip-flops when exiting the low-power mode.
Public/Granted literature
- US20150188519A1 DUAL EDGE-TRIGGERED RETENTION FLIP-FLOP Public/Granted day:2015-07-02
Information query
IPC分类: