Invention Grant
- Patent Title: ESD protection circuits and methods
- Patent Title (中): ESD保护电路和方法
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Application No.: US13683793Application Date: 2012-11-21
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Publication No.: US09281681B2Publication Date: 2016-03-08
- Inventor: Li-Wei Chu , Tzu-Heng Chang , Yu-Ti Su , Jen-Chou Tseng
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H02H9/00
- IPC: H02H9/00 ; H02H9/04 ; H02H3/22 ; H02H3/20

Abstract:
An electrostatic discharge protection circuit includes a first LC resonator circuit coupled to an input node and disposed in parallel with an internal circuit that is also coupled to the input node, and a second LC resonator circuit coupled in series with the first LC resonator circuit at a first node. The first LC resonator circuit is configured to resonate at a different frequency than a frequency the second LC resonator circuit is configured to resonate.
Public/Granted literature
- US20140139958A1 ESD PROTECTION CIRCUITS AND METHODS Public/Granted day:2014-05-22
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