Invention Grant
- Patent Title: Memory cells, memory systems, and memory programming methods
- Patent Title (中): 存储单元,存储器系统和存储器编程方法
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Application No.: US13837911Application Date: 2013-03-15
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Publication No.: US09293196B2Publication Date: 2016-03-22
- Inventor: Wataru Otsuka , Takafumi Kunihiro , Tomohito Tsushima , Makoto Kitigawa , Jun Sumino , D. V. Nirmal Ramaswamy
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; H01L45/00

Abstract:
Memory cells, memory systems and methods are described. In one embodiment, a memory cell includes electrodes and a memory element, and a first electrically conductive structure is formed within dielectric material providing the memory element in a low resistance state as a result of a first voltage of a first polarity being applied across the electrodes. Additionally, the first electrically conductive structure is removed from the dielectric material providing the memory element in a high resistance state as a result of a second voltage of a second polarity, which is opposite to the first polarity, being applied across the electrodes. A permanent and irreversible electrically conductive structure is formed within the dielectric material providing the memory element in the low resistance state as a result of a third voltage of the second polarity and having an increased potential compared with the second voltage being applied across the electrodes.
Public/Granted literature
- US20140268992A1 Memory Cells, Memory Systems, and Memory Programming Methods Public/Granted day:2014-09-18
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