发明授权
- 专利标题: Method for testing an analytical instrument
- 专利标题(中): 分析仪器测试方法
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申请号: US14179165申请日: 2014-02-12
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公开(公告)号: US09297821B2公开(公告)日: 2016-03-29
- 发明人: Christian Walter , Félix Bécheiraz , Manuela Gerber , Rolf Rohner
- 申请人: Mettler-Toledo AG
- 申请人地址: CH Greifensee
- 专利权人: Mettler-Toledo GmbH
- 当前专利权人: Mettler-Toledo GmbH
- 当前专利权人地址: CH Greifensee
- 代理机构: Standley Law Group LLP
- 优先权: EP13155158 20130214
- 主分类号: G01N31/16
- IPC分类号: G01N31/16 ; G01N1/10 ; G01N21/41 ; G01N35/00 ; G01N9/00 ; G01J3/02 ; G01N21/13
摘要:
A method and system for testing the functional capability of an analytical instrument uses first and second blind samples. Each blind sample is a test substance with an amount of a parameter to be tested that is unknown to the user. Each blind sample is provided with an identification means with a unique identification. When the blind samples are tested by the user in the instrument being tested, the measurement values obtained and the unique identifications read are compared against predetermined values that are accessible to a test program configured as software on the analytical instrument. By comparison of the measurement values and the predetermined values, the functional capability of the analytical instrument is determined and the result is transmitted to an output unit of the analytical instrument.
公开/授权文献
- US20140227791A1 METHOD FOR TESTING AN ANALYTICAL INSTRUMENT 公开/授权日:2014-08-14
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