Invention Grant
- Patent Title: Cross-coupled voltage and temperature monitoring in programmable integrated circuits
- Patent Title (中): 可编程集成电路中的交叉耦合电压和温度监控
-
Application No.: US14463560Application Date: 2014-08-19
-
Publication No.: US09304174B1Publication Date: 2016-04-05
- Inventor: Bradley L. Taylor , Sagheer Ahmad
- Applicant: Xilinx, Inc.
- Applicant Address: US CA San Jose
- Assignee: XILINX, INC.
- Current Assignee: XILINX, INC.
- Current Assignee Address: US CA San Jose
- Agent Robert M. Brush
- Main IPC: H03K19/177
- IPC: H03K19/177 ; G06F1/00 ; G01R31/40 ; G01R17/02 ; G01R19/00 ; G01K17/00
Abstract:
Method and apparatus for monitoring system operations in an integrated circuit. A method includes receiving a first power supply voltage from a first processing domain, comparing the first power supply voltage to a first reference voltage, receiving the second power supply voltage from the second processing domain, comparing the second power supply voltage to a second reference voltage, determining that the first power supply voltage exceeds the first reference voltage or that the second power supply voltage exceeds the second reference voltage, and transmitting one or more alarms corresponding to one or more of the first power supply voltage and the second power supply voltage in response to determining that the first power supply voltage exceeds the first reference voltage or that the second power supply voltage exceeds the second reference voltage. An integrated circuit and system monitor are also provided.
Information query
IPC分类:
