Invention Grant
- Patent Title: Method for the reduction of defectivity in vapor deposited films
- Patent Title (中): 降低气相沉积膜缺陷率的方法
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Application No.: US14158536Application Date: 2014-01-17
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Publication No.: US09328416B2Publication Date: 2016-05-03
- Inventor: Arul N. Dhas , Akhil Singhal , Ming Li , Kareem Boumatar
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: C23C16/40
- IPC: C23C16/40 ; C23C16/44 ; C23C16/455

Abstract:
Methods for depositing film on substrates are described. In various cases, a high thermal conductivity gas such as helium is used to deposit a conditioning layer on surfaces of the reaction chamber before it is used to process substrates. The helium may be used to help atomize/vaporize a liquid reactant in a heated injection module before the reactant is delivered to the reaction chamber. In some embodiments, a purge gas including helium is used during a post-deposition purge during deposition on substrates. The disclosed embodiments allow for mixed recipe processing without having to clean the reaction chamber between recipes, and without forming a high number of particles/defects on the substrates. This allows for an improved throughput of high quality film, even where mixed recipes are used in a single reaction chamber.
Public/Granted literature
- US20150203967A1 METHOD AND APPARATUS FOR THE REDUCTION OF DEFECTIVITY IN VAPOR DEPOSITED FILMS Public/Granted day:2015-07-23
Information query
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