Invention Grant
- Patent Title: Chip package incorporating interfacial adhesion through conductor sputtering
- Patent Title (中): 通过导体溅射结合界面粘合的芯片封装
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Application No.: US14506357Application Date: 2014-10-03
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Publication No.: US09331017B2Publication Date: 2016-05-03
- Inventor: Tao Wu , Islam A. Salama
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40 ; H01L23/522 ; H01L21/768 ; H01L23/525 ; H01L23/532

Abstract:
This disclosure relates generally to an electronic device and method having can include a method of making a chip package. An insulator layer comprising an insulator material, the insulator layer positioned with respect to a first conductive line, forming a second conductive line with respect to the insulator layer, wherein the insulator layer is positioned between the first conductive line and the second conductive line, forming a opening in the insulator layer between the first conductive line and the second conductive line, at least some of the insulator material within the opening being exposed, and chemically bonding a conductor to the at least some of the insulator material within the opening, wherein the conductor electrically couples the first conductive line to the second conductive line.
Public/Granted literature
- US20150021778A1 CHIP PACKAGE INCORPORATING INTERFACIAL ADHESION THROUGH CONDUCTOR SPUTTERING Public/Granted day:2015-01-22
Information query
IPC分类: