A test and measurement system including an electro-optical voltage accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical voltage accessory with a variable input signal that exceeds a linear input range of the optical sensor, and a processor. The processor is configured to modify the modulated output signal from the electro-optical voltage accessory to reconstruct the variable input signal of the electro-optical voltage accessory that exceeds the linear input range of the optical sensor.