Invention Grant
- Patent Title: Method of forming copper sulfide film for reducing copper oxidization and loss
- Patent Title (中): 形成硫化铜膜以减少铜氧化和损失的方法
-
Application No.: US14162737Application Date: 2014-01-24
-
Publication No.: US09337036B2Publication Date: 2016-05-10
- Inventor: Zusing Yang , Hong-Ji Lee
- Applicant: Macronix International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Stout, Uxa & Buyan, LLP
- Agent Frank J. Uxa
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/16 ; H01L21/02 ; H01L21/027

Abstract:
Effects of copper oxide formation in semiconductor manufacture are mitigated by etching with sulfide plasmas. The plasmas form protective copper sulfide films on copper surfaces and prevent copper oxide formation. When copper oxide formation does occur, the sulfide plasmas are able to transform the copper oxide into acceptable or more conductive copper compounds. Non-oxide copper compounds are removed using clear wet strips.
Public/Granted literature
- US20150214054A1 Method of Forming Copper Sulfide Film for Reducing Cu Oxidization and Loss Public/Granted day:2015-07-30
Information query
IPC分类: