Invention Grant
- Patent Title: Temperature compensated PLL calibration
- Patent Title (中): 温度补偿PLL校准
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Application No.: US13837070Application Date: 2013-03-15
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Publication No.: US09344094B2Publication Date: 2016-05-17
- Inventor: Jeffrey W. Waldrip , Yongping Fan , Jing Li
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Green, Howard & Mughal LLP
- Main IPC: H03L7/087
- IPC: H03L7/087 ; H03L1/02 ; H03B5/04 ; H03B5/08 ; H03L7/10
Abstract:
In some embodiments, provided are AFC circuits and methods for calibrating a second setting of an oscillator while a first setting is controlled by a temperature compensated control.
Public/Granted literature
- US20140266472A1 TEMPERATURE COMPENSATED PLL CALIBRATION Public/Granted day:2014-09-18
Information query
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