Invention Grant
- Patent Title: Continuous frequency measurement for predictive periodic synchronization
- Patent Title (中): 连续频率测量用于预测周期性同步
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Application No.: US14061529Application Date: 2013-10-23
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Publication No.: US09344099B2Publication Date: 2016-05-17
- Inventor: Mark Buckler
- Applicant: ADVANCED MICRO DEVICES, INC.
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices Inc.
- Current Assignee: Advanced Micro Devices Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Staniford Tomita LLP
- Main IPC: G01R25/00
- IPC: G01R25/00 ; H03D13/00 ; H03L7/193 ; H03L7/091 ; H03L7/087

Abstract:
Embodiments are described for a method of continuously measuring the ratio of frequencies between the transmit and receive clock domains of a heterochronous system using an array of digital frequency measurement circuits that provide overlapping frequency and detection interval measurements within single counter periods required for a single frequency measurement circuit to complete a frequency measurement. Embodiments may be used in a predictive synchronizer to provide low latency, continuous frequency measurements for system-on-chip (SOC) devices that employ frequency drift or ramping to reduce power consumption and overheating conditions.
Public/Granted literature
- US20150109028A1 CONTINUOUS FREQUENCY MEASUREMENT FOR PREDICTIVE PERIODIC SYNCHRONIZATION Public/Granted day:2015-04-23
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