Invention Grant
- Patent Title: Resistive random-access memory devices
- Patent Title (中): 电阻式随机存取存储器件
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Application No.: US13974001Application Date: 2013-08-22
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Publication No.: US09378785B2Publication Date: 2016-06-28
- Inventor: Chih-He Lin , Sih-Han Li , Wen-Pin Lin , Shyh-Shyuan Sheu
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Priority: TW101139018A 20121023
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C7/10 ; G11C13/00

Abstract:
A resistive random-access memory device includes a memory array, a read circuit, a write-back logic circuit and a write-back circuit. The read circuit reads the data stored in a selected memory cell and accordingly generates a first control signal. The write-back logic circuit generates a write-back control signal according to the first control signal and a second control signal. The write-back circuit performs a write-back operation on the selected memory cell according to the write-back control signal and a write-back voltage, so as to change a resistance state of the selected memory cell from a low resistance state to a high resistance state, and generates the second control signal according to the resistance state of the selected memory cell.
Public/Granted literature
- US20140115243A1 RESISTIVE RANDOM-ACCESS MEMORY DEVICES Public/Granted day:2014-04-24
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