Invention Grant
- Patent Title: Barrier film defect detecting method and apparatus
- Patent Title (中): 阻隔膜缺陷检测方法及装置
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Application No.: US14019476Application Date: 2013-09-05
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Publication No.: US09389197B2Publication Date: 2016-07-12
- Inventor: Alexander Voronov , Gyoo-Wan Han , Ji-Hun Jung
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR10-2013-0016976 20130218
- Main IPC: G01R27/08
- IPC: G01R27/08 ; G01N27/20 ; G01N27/02 ; G01N19/08 ; G01N21/88 ; G01N23/18
Abstract:
A method for detecting a defect of a barrier film includes preparing a device including an electrode and a barrier film covering the electrode, allowing a charged medium to contact a surface of the barrier film, and measuring a change in a flow of current between the charged medium and the electrode.
Public/Granted literature
- US20140232419A1 BARRIER FILM DEFECT DETECTING METHOD AND APPARATUS Public/Granted day:2014-08-21
Information query
