公开(公告)号：US09389197B2

公开(公告)日：2016-07-12

申请号：US14019476

申请日：2013-09-05

Applicant: Samsung Display Co., Ltd.

Inventor： Alexander Voronov ,  Gyoo-Wan Han ,  Ji-Hun Jung

IPC: G01R27/08 ,  G01N27/20 ,  G01N27/02 ,  G01N19/08 ,  G01N21/88 ,  G01N23/18

CPC classification number: G01N27/20 ,  G01N19/08 ,  G01N21/88 ,  G01N23/18 ,  G01N27/02

Abstract: A method for detecting a defect of a barrier film includes preparing a device including an electrode and a barrier film covering the electrode, allowing a charged medium to contact a surface of the barrier film, and measuring a change in a flow of current between the charged medium and the electrode.

Abstract translation: 用于检测阻挡膜的缺陷的方法包括制备包括电极和覆盖电极的阻挡膜的器件，允许带电介质接触阻挡膜的表面，并测量电荷流动之间的电流流动的变化 介质和电极。

公开(公告)号：US20140232419A1

公开(公告)日：2014-08-21

申请号：US14019476

申请日：2013-09-05

Applicant: Samsung Display Co., Ltd.

Inventor： Alexander Voronov ,  Gyoo-Wan Han ,  Ji-Hun Jung

IPC: G01N27/20

CPC classification number: G01N27/20 ,  G01N19/08 ,  G01N21/88 ,  G01N23/18 ,  G01N27/02

Abstract: A method for detecting a defect of a barrier film includes preparing a device including an electrode and a barrier film covering the electrode, allowing a charged medium to contact a surface of the barrier film, and measuring a change in a flow of current between the charged medium and the electrode.

Abstract translation: 用于检测阻挡膜的缺陷的方法包括制备包括电极和覆盖电极的阻挡膜的器件，允许带电介质接触阻挡膜的表面，并测量电荷流动之间的电流流动的变化 介质和电极。