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US09390791B2 Resistance change non-volatile storage memory device and method 有权
电阻变化非易失性存储器件及方法

Resistance change non-volatile storage memory device and method
Abstract:
A data recording method includes recording data in memory cells on the basis of whether each memory cell is in an initial state or a variable state. The recording step includes (A) applying a forming stress to a selected memory cell in the initial state, and (B) setting a resistance value of the selected memory cell to within a first resistance range by (b1) applying a first correction signal to the selected memory cell if the resistance value of the selected memory cell is greater than a first reference value, and (b2) applying a second correction signal to the selected memory cell if the resistance value of the selected memory cell is smaller than a second reference value.
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